DocumentCode :
2604961
Title :
Failure Mechanism on Accelerated ac Test for High Voltage Capacitors
Author :
Burnham, J. ; Wong, E.
Author_Institution :
Components and Materials Laboratories, Equipment Engineering Divisions, Hughes Aircraft Company, Culver City, California
fYear :
1974
fDate :
27120
Firstpage :
223
Lastpage :
233
Abstract :
A highly accelerated ac life test for high voltage dc capacitors has been developed which is useful for solid dielectric capacitors such as mica paper and high dielectric constant ceramics with low ac losses. The test utilizes the fact that corona intensity on ac is several orders of magnitude higher than on dc. It is shown that the mechanism of failure involves electrochemical erosion for both the mica paper and the ceramic dielectric material. The life times follow a power law with an exponent of 26 for mnica paper and 31 to 100 for the ceramic.
Keywords :
Capacitors; Ceramics; Corona; Dielectric losses; Failure analysis; High-K gate dielectrics; Life estimation; Life testing; Solids; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1974. 12th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1974.362650
Filename :
4208028
Link To Document :
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