• DocumentCode
    2604969
  • Title

    Improvements to ADEPT-a VHDL based integrated design environment for performance and dependability analysis

  • Author

    Klenke, Robert H. ; Aylor, James H. ; Johnson, Barry W. ; Choi, Charles Y. ; Meyassed, Moshe ; Rao, Ramesh ; Dungan, William W.

  • Author_Institution
    Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    190
  • Lastpage
    199
  • Abstract
    This paper presents improvements to the Advanced Design Environment Prototype Tool (ADEPT) that have been developed under the RASSP (Rapid Prototyping of Application Specific Signal Processors) program. ADEPT is an integrated design environment based on IEEE 1076 VHDL that supports the design and analysis of digital systems from initial concept to the final implementation. Improvements that have been made to ADEPT in the areas of mixed-level modeling-the cosimulation of performance and behavioral models, dependability modeling and analysis, modeling libraries, and post simulation data visualization tools, are presented
  • Keywords
    IEEE standards; application specific integrated circuits; circuit analysis computing; circuit reliability; data visualisation; digital signal processing chips; digital simulation; hardware description languages; high level synthesis; ADEPT; Advanced Design Environment Prototype Tool; IEEE 1076; RASSP program; Rapid Prototyping of Application Specific Signal Processors; VHDL; behavioral models; cosimulation; data visualization tools; dependability analysis; digital systems; integrated design environment; mixed-level modeling; modeling libraries; performance analysis; Analytical models; Costs; Design engineering; Digital systems; Performance analysis; Prototypes; Signal design; Signal processing; Software libraries; Space exploration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VHDL International Users' Forum, 1997. Proceedings
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-8186-8180-2
  • Type

    conf

  • DOI
    10.1109/VIUF.1997.623950
  • Filename
    623950