• DocumentCode
    2604980
  • Title

    Adapting JTAG for AC interconnect testing

  • Author

    Whetsel, Lee

  • Author_Institution
    Texas Instruments, Sherman, TX, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    96
  • Abstract
    The use of AC coupled interconnects to provide communication paths between devices are increasing. The existing IEEE 1149.1 boundary scan standard (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.
  • Keywords
    IEEE standards; boundary scan testing; integrated circuit interconnections; integrated circuit testing; logic testing; AC coupled interconnects; AC interconnect testing; IEEE 1149.1 standard; JTAG; boundary scan standard; Capacitors; Circuit testing; Instruments; Integrated circuit interconnections; Intelligent networks; Logic testing; Registers; Resistors; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271199
  • Filename
    1271199
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2604980