Title :
TRIBuTE™ board and platform test methodology
Author_Institution :
Enterprise Platforms Div., Intel Corp., Hillsboro, OR, USA
fDate :
30 Sept.-2 Oct. 2003
Abstract :
Built-in-self-test (BIST) has been historically silicon-centric in its application. This paper offers an overview of Intel´s next generation platform test methodology, TRIBUTE™. TRIBUTE™ is an Intel coined acronym shorthand for Three-Reuseable-Integrated-Bist-u-TEchnologies. The TRIBuTE™ approach targets the replacement of today´s standard platform testing process and exploits BIST in a novel way....comprehensive board and platform testing.
Keywords :
built-in self test; printed circuit testing; production testing; Intel; TRIBuTE; Three-Reuseable-Integrated-Bist-u-TEchnologies; board test; built-in-self-test; platform test methodology; standard platform testing process; Built-in self-test; Circuit faults; Circuit testing; Manufacturing processes; Operating systems; Printed circuits; Probes; Production facilities; Software testing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271200
