Title :
IBIST™ (interconnect built-in-self-test) architecture and methodology for PCI Express
Author_Institution :
Enterprise Platforms Div., Intel Corp., Hillsboro, OR, USA
fDate :
30 Sept.-2 Oct. 2003
Abstract :
This paper summarizes the test challenges associated with next generation platform buses and introduces an Intel developed technology called IBIST™ created to meet those challenges. The IBIST™ testing methodology and associated on-die architecture customized for the PCI Express (PCIe) interface are described.
Keywords :
built-in self test; integrated circuit interconnections; peripheral interfaces; production testing; IBIST™; Intel; PCI Express interface; interconnect built-in-self-test; on-die architecture; platform buses; testing methodology; Built-in self-test; Circuit testing; Electromagnetic interference; Integrated circuit interconnections; Manufacturing; Power transmission lines; Production facilities; Routing; Silicon; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271201
