مرکز منطقه ای اطلاع رساني علوم و فناوري - Degradation Studies in GaAs .6P.4 Light-Emitting Diodes

DocumentCode :

2605064

Title :

Degradation Studies in GaAs .6P.4 Light-Emitting Diodes

Author :

Weissman, R.H. ; Snyder, W.L. ; Ikari, G.T. ; Larsen, T.L.

Author_Institution :

Hewlett-Packard Company, HPA Division, 640 Page Mill Rd., Palo Alto, CA 94304

fYear :

1974

fDate :

27120

Firstpage :

273

Lastpage :

277

Keywords :

Copper; Degradation; Gallium arsenide; Light emitting diodes; Semiconductor diodes; Semiconductor materials; Substrates; Tellurium; Testing; Zinc;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability Physics Symposium, 1974. 12th Annual

Conference_Location :

Las Vegas, NV, USA

ISSN :

0735-0791

Type :

conf

DOI :

10.1109/IRPS.1974.362657

Filename :

4208035

Link To Document :