Title :
Expected Annual Fraction of Data Loss as a Metric for Data Storage Reliability
Author :
Iliadis, Ilias ; Venkatesan, Vinodh
Author_Institution :
IBM Res. - Zurich, Ruschlikon, Switzerland
Abstract :
Several redundancy and recovery schemes have been developed to enhance the reliability of storage systems. The effectiveness of these schemes has predominately been evaluated based on the mean time to data loss (MTTDL) metric, which has been proven useful for assessing tradeoffs, for comparing schemes, and for estimating the effect of the various parameters on system reliability. In the context of distributed and cloud storage systems, for economical reasons, it is of great importance to also consider the magnitude along with the frequency of data loss. We focus on the following reliability metric: the expected annual fraction of data loss (EAFDL), that is, the fraction of stored data that is expected to be lost by the system annually. We present a general methodology to obtain the EAFDL metric analytically, in conjunction with the MTTDL metric, for various redundancy schemes and for a large class of failure time distributions that also includes real-world distributions like Weibull and gamma. As a demonstration, we subsequently apply this methodology to derive these metrics analytically and to assess the reliability of a replication-based storage system under clustered, declustered, and symmetric data placement schemes. We show that the declustered placement scheme offers superior reliability in terms of both metrics. Previous work has used simulation to evaluate the magnitude of data loss, but this is the first work to analytically assess it, and the first to present a general theoretical framework for this context.
Keywords :
cloud computing; data protection; pattern clustering; redundancy; reliability; statistical distributions; storage management; EAFDL metric; MTTDL metric; cloud storage systems; data storage reliability; declustered data placement schemes; distributed storage systems; expected annual fraction of data loss; failure time distributions; mean time to data loss metric; recovery schemes; redundancy schemes; replication-based storage system; storage system reliability; symmetric data placement schemes; Analytical models; Bandwidth; Context; Markov processes; Measurement; Redundancy;
Conference_Titel :
Modelling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS), 2014 IEEE 22nd International Symposium on
Conference_Location :
Paris
DOI :
10.1109/MASCOTS.2014.53