Title :
Evolution of IEEE 1149.1 addressable shadow protocol devices
Author :
Josh, Rakesh N. ; Williams, Kenneth L. ; Whetsel, Lee
Author_Institution :
Texas Instruments, Inc., Sherman, TX, USA
fDate :
30 Sept.-2 Oct. 2003
Abstract :
This paper describes an addressable shadow protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 1149.1 device chains existing on a board or module. The enhanced device provides for improvement in test, emulation, programming, and other applications based on the 1149.1 test bus.
Keywords :
IEEE standards; boundary scan testing; protocols; IEEE 1149.1 standard; JTAG; addressable shadow protocol device; backplane; boundary scan architecture; connectivity; enhanced device; integrated circuit devices; serial test bus; test bus; Application specific processors; Backplanes; Circuit testing; Emulation; Instruments; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Protocols; Synchronization;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271206
