Smart subsystem architectures key to effective MATE RF and microwave testing

The authors examine problems of radio frequency (RF) testing and offer a possible MATE (modular automatic test equipment) solution in the form of a flexible subsystem architecture that meets the technical demands of RF testing and the life-cycle support objectives of MATE. The authors discuss the functional aspects of the architecture and its flexibility for satisfying a wide variety of complex RF test requirements. The modular aspects of the architecture are considered, including internal interfaces and compliance with the MATE philosophy. The distributed system architecture facilitated by smart subsystems provides reconfigurable software and dynamic control of ATE assets. The architecture provides two key features: transparent access to application-specific system capabilities and tightly coupled control of test-station assets. This basic architecture can be adapted to many different test requirements, including tightly coupled test functions, path-loss signal compensation, and unique algorithm processing