Title :
Board test coverage: the value of prediction and how to compare numbers
Author :
Rijckaert, Wouter ; De Jong, Frans
Author_Institution :
Centre for Ind. Technol., Philips, Eindhoven, Netherlands
fDate :
30 Sept.-2 Oct. 2003
Abstract :
Test coverage prediction for board-assemblies has an important function in, among others, test engineering, test cost modeling, test strategy definition and product quality estimation. Introducing a method that defines how this coverage is calculated can increase the value of such prediction across the electronics industry. We consider the three aspects to test coverage calculation: fault modeling, coverage per fault and total coverage. An abstraction level for fault categories is introduced, called MPS (material, placement, soldering) that enables us to compare coverage results using different fault models. Additionally, the rule based fault coverage estimation and the weighted coverage calculation are discussed.
Keywords :
electronic engineering computing; estimation theory; fault diagnosis; printed circuit testing; MPS; board test coverage; electronics industry; fault categories; fault modeling; fault models; product quality estimation; test cost modeling; test coverage prediction; test engineering; test strategy definition; weighted coverage calculation; Assembly; Circuit faults; Circuit testing; Costs; Electronics industry; Predictive models; Printed circuits; Production; Soldering; Uninterruptible power systems;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271209