DocumentCode :
2605174
Title :
Selecting PXI architecture for board (system) functional test
Author :
Smitt, Eric L.
Author_Institution :
ELS Designs
Volume :
2
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
207
Lastpage :
207
Keywords :
Current measurement; Electrical resistance measurement; Hardware; Instruments; Investments; Performance evaluation; Pulse measurements; Switches; System testing; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271212
Filename :
1271212
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2605174
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