• DocumentCode
    2605272
  • Title

    Band Structure Effects on the Current-Voltage Characteristics of SNW-FETs

  • Author

    Gnani, Elena ; Gnudi, Antonio ; Reggiani, Susanna ; Rudan, Massimo ; Baccarani, Giorgio

  • Author_Institution
    Univ. of Bologna, Bologna
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    737
  • Lastpage
    740
  • Abstract
    In this work we investigate band structure effects on the current-voltage characteristics of ultra-scaled silicon nanowire (SNW)FETs. A new approach is used for the computation of quantum transport which accounts for the complete periodic shape of the IDEG energy subbands. The main findings of our model are: i) a possible negative output conductance for small cross-sections due to the finite energy extension of the sub- bands; ii) an increase of the transit time due to a reduced average velocity and, iii) a worsening of the subthreshold slope for short channel lengths.
  • Keywords
    field effect transistors; nanowires; silicon; SNW-FET; band structure effects; current-voltage characteristics; quantum transport; ultrascaled silicon nanowire; Atomic measurements; Current-voltage characteristics; Eigenvalues and eigenfunctions; Electrons; FETs; Potential energy; Predictive models; Quantum computing; Shape; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4419052
  • Filename
    4419052