DocumentCode
2605272
Title
Band Structure Effects on the Current-Voltage Characteristics of SNW-FETs
Author
Gnani, Elena ; Gnudi, Antonio ; Reggiani, Susanna ; Rudan, Massimo ; Baccarani, Giorgio
Author_Institution
Univ. of Bologna, Bologna
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
737
Lastpage
740
Abstract
In this work we investigate band structure effects on the current-voltage characteristics of ultra-scaled silicon nanowire (SNW)FETs. A new approach is used for the computation of quantum transport which accounts for the complete periodic shape of the IDEG energy subbands. The main findings of our model are: i) a possible negative output conductance for small cross-sections due to the finite energy extension of the sub- bands; ii) an increase of the transit time due to a reduced average velocity and, iii) a worsening of the subthreshold slope for short channel lengths.
Keywords
field effect transistors; nanowires; silicon; SNW-FET; band structure effects; current-voltage characteristics; quantum transport; ultrascaled silicon nanowire; Atomic measurements; Current-voltage characteristics; Eigenvalues and eigenfunctions; Electrons; FETs; Potential energy; Predictive models; Quantum computing; Shape; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4419052
Filename
4419052
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