DocumentCode :
2605337
Title :
EEG analysis for understanding stress based on affective model basis function
Author :
Rahnuma, Kazi Shahzabeen ; Wahab, Abdul ; Kamaruddin, Norhaslinda ; Majid, Hariyati
Author_Institution :
Kulliyyah of Inf. & Commun. Technol., Int. Islamic Univ. Malaysia (IIUM), Kuala Lumpur, Malaysia
fYear :
2011
fDate :
14-17 June 2011
Firstpage :
592
Lastpage :
597
Abstract :
Coping with stress has shown to be able to avoid many complications in medical condition. In this paper we present an alternative method in analyzing and understanding stress using the four basic emotions of happy, calm, sad and fear as our basis function. Electroencephalogram (EEG) signals were captured from the scalp of the brain and measured in responds to various stimuli from the four basic emotions to stimulating stress base on the IAPS emotion stimuli. Features from the EEG signals were extracted using the Kernel Density Estimation (KDE) and classified using the Multilayer Perceptron (MLP), a neural network classifier to obtain accuracy of the subject´s emotion leading to stress. Results have shown the potential of using the basic emotion basis function to visualize the stress perception as an alternative tool for engineers and psychologist.
Keywords :
electroencephalography; medical signal processing; multilayer perceptrons; neural nets; signal classification; EEG analysis; EEG signals; IAPS emotion stimuli; KDE; MLP; affective model basis function; calm emotion; electroencephalography; fear emotion; happy emotion; kernel density estimation; multilayer perceptron; neural network classifier; sad emotion; stress perception; Accuracy; Brain; Electroencephalography; Feature extraction; Humans; Kernel; Stress; Arousal (A); Electroencephalography (EEG); Kernel Density Estimation (KDE); Multi-layer Perceptron (MLP); Valance (V);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics (ISCE), 2011 IEEE 15th International Symposium on
Conference_Location :
Singapore
ISSN :
0747-668X
Print_ISBN :
978-1-61284-843-3
Type :
conf
DOI :
10.1109/ISCE.2011.5973899
Filename :
5973899
Link To Document :
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