Title :
Migrated-Gold Resistive Shorts in Microcircuits
Author :
Shumka, Alex ; Piety, Richard R.
Author_Institution :
California Institute of Technology, Jet Propulsion Laboratory, Pasadena, Ca. 91103
Abstract :
Failures, failure modes and failure mechanisms related to the formation of migrated-gold resistive shorts (MGRS) in gold-metallized microcircuits will be described. Also, three different methods of screening devices for MGRS will be presented and the impact MGRS can have on device reliability will be discussed.
Keywords :
Anodes; Cathodes; Chemicals; Failure analysis; Gold; Laboratories; Metallization; Nonhomogeneous media; Propulsion; Scanning electron microscopy;
Conference_Titel :
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1975.362681
