Title :
Proceedings of ESSDERC 2005. 35th European Solid-State Device Research Conference (IEEE Cat. No. 05EX1087)
Abstract :
The following topics are dealt with: MOSFET; nanoelectronics; semiconductor device modeling; RF devices; nanoscaled devices; dynamic random access memories; high k and medium k dielectrics; nanowires; silicon on insulator; power semiconductor devices; organic devices; back end characterisation; device and circuit reliability; strained silicon characterization; semiconductor device noise; biological and optical devices; ESD protection; CMOS technology; high speed memories and carrier mobility.
Keywords :
CMOS integrated circuits; DRAM chips; MOSFET; carrier mobility; electron transport theory; electrostatic discharge; elemental semiconductors; high-k dielectric thin films; high-speed integrated circuits; nanoelectronics; nanowires; organic semiconductors; power semiconductor devices; semiconductor device models; semiconductor device noise; silicon-on-insulator; CMOS technology; ESD protection; MOSFET device; RF devices; biological devices; carrier mobility; dynamic random access memories; electron transport; high k dielectrics; high speed memories; medium k dielectrics; nanoelectronics; nanoscaled devices; nanowires; optical devices; organic devices; power semiconductor devices; semiconductor device modeling; semiconductor device noise; silicon on insulator;
Conference_Titel :
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Conference_Location :
Grenoble, France
Print_ISBN :
0-7803-9203-5
DOI :
10.1109/ESSDER.2005.1545734
