Title :
Circular GaN Membrane Gratings
Author :
Yongjin Wang ; Zheng Shi ; Xin Li ; Lopez-Garcia, Martin ; Lifeng Chen ; Hueting, Nikolai A. ; Cryan, Martin J. ; Miao Zhang ; Hongbo Zhu
Author_Institution :
Gruenberg Res. Centre, Nanjing Univ. of Posts & Telecommun., Nanjing, China
Abstract :
This letter presents the fabrication and characterization of freestanding circular GaN gratings on a GaN-on-silicon platform. Optical modes propagate within the freestanding GaN membrane and their number decreases as the thickness of GaN membrane is reduced. Backside thinning of freestanding GaN membranes is used to obtain thinner GaN membranes that are helpful to reduce resonance modes and to broaden the reflectance interference fringes in the visible range. Strong coupling between the incident light and the circular grating is confirmed by angular-resolved reflectance measurement. The influences of the grating parameters on the reflectance spectra are investigated. This letter opens the way to fabricate single-layer GaN resonant gratings in the visible wavelength range.
Keywords :
III-V semiconductors; diffraction gratings; elemental semiconductors; gallium compounds; infrared spectra; light propagation; membranes; optical fabrication; silicon; visible spectra; wide band gap semiconductors; GaN-Si; GaN-on-silicon platform; angular-resolved reflectance measurement; freestanding circular membrane gratings; grating parameters; membrane thickness; optical mode propagation; reflectance interference fringes; reflectance spectra; resonance modes; single-layer resonant gratings; visible wavelength range; Gallium nitride; Gratings; Interference; Optical device fabrication; Optical reflection; Optimized production technology; Reflectivity; Circular GaN membrane grating; angular resolved microreflectance; backside thinning;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2014.2310211