Title :
Reliability Study of GaAs, 63P.37 LED´S
Author_Institution :
McDonnell Douglas Astronautics Company - East, St. Louis, Missouri 63166
Abstract :
A comprehensive study of the long life and reliability characteristics of a hermetically sealed GaAsP LED has been performed using accelerated life test techniques. A degradation model was developed based on the Arrhenius equation which was found to describe a lognormal failure distribution. The Extended-Longini failure mechanism was expanded to include the effects of crystalline dislocations.
Keywords :
Crystallization; Degradation; Equations; Failure analysis; Gallium arsenide; Hermetic seals; Life estimation; Life testing; Light emitting diodes; Performance evaluation;
Conference_Titel :
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1975.362695
