Title :
RC circuit model for multi-walled carbon nanotubes
Author :
Nieuwoudt, Arthur ; Massoud, Yehia
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX
Abstract :
To alleviate the problems associated with current copper interconnect technology, multi-walled carbon nanotubes (MWCNTs) have been proposed as a potential solution for on-chip communication in VLSI applications. In this paper, we develop an equivalent RC circuit model for MWCNT interconnect that captures both DC conductance and high frequency impedance due to capacitive effects. Based on the circuit model, we find that MWCNT-based interconnect can have substantially less delay than copper wires in global interconnect applications.
Keywords :
RC circuits; VLSI; carbon nanotubes; copper; electrical resistivity; integrated circuit interconnections; semiconductor device models; C; Cu; DC conductance; MWCNT interconnect; RC circuit model; VLSI applications; copper wires; current copper interconnect technology; global interconnect applications; high-frequency impedance; multiwalled carbon nanotubes; on-chip communication; Carbon nanotubes; Contact resistance; Copper; Delay; Frequency; Impedance; Integrated circuit interconnections; Optical scattering; Very large scale integration; Wires; Carbon nanotubes; multi-walled nanotube; nanotube interconnect;
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
DOI :
10.1109/NANO.2007.4601276
