DocumentCode

2605862

Title

Practical Applications of Accelerated Testing - Introduction

Author

Peck, D.S.

Author_Institution

Bell Telephone Laboratories, Incorporated Allentown, Pennsylvania 18103

fYear

1975

fDate

27485

Firstpage

253

Lastpage

254

Keywords

Circuit testing; Degradation; Electromigration; Failure analysis; Life estimation; Metallization; Semiconductor devices; Silicon; Stress; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1975. 13th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1975.362703

Filename

4208084