DocumentCode
2605884
Title
Applied of look up table controller based of FLC (fuzzy logic controller) in non-linear system AFM (atomic force microscopy)/PSTM (photon scanning tunnel microscope)
Author
Ari, Santoso ; Belier, B. ; Nuh, Mohammad ; Jazidie, Achmad ; Rameli, Mochamad ; Castagne, M. ; Falgayrttes, P.
Author_Institution
Dept. of Electr. Eng., ITS, Sukolilo, Indonesia
Volume
2
fYear
2002
fDate
2002
Firstpage
565
Abstract
The problems of AFM/PSTM with piezoelectronic motor are how to control the fast and precise motion of the piezoelectronic because of its nonlinear hysteresis characteristic. On the other hand, in order to scan the surface and optical characteristics simultaneously in semiconductor material using AFM/PSTM, high speed microscope motion is required. FLC is one of the most effective algorithms to control a nonlinear system. This paper, the application of FLC to AFM/PSTM as a class nonlinear system is proposed. A look up table (LUT) controller based on FLC is used in order to overcome the quick response of the piezoelectronic motor. It was shown that the obtained images are noisy and the filter could not perfectly eliminate the noise. Nevertheless, the LUT controller based on FLC is able to overcome the nonlinear and noise problems well.
Keywords
atomic force microscopy; fuzzy control; fuzzy logic; machine control; optical microscopy; physical instrumentation control; piezoelectric motors; programmable controllers; scanning tunnelling microscopy; table lookup; AFM/PSTM; FLC; LUT controller; atomic force microscopy; class nonlinear system; fuzzy logic controller; high speed microscope motion; imperfect filter noise elimination; look up table controller; motor motion control; noisy images; nonlinear hysteresis characteristic; nonlinear system control; optical characteristic; photon scanning tunnel microscope; piezoelectronic motor; semiconductor material; surface characteristic; Atomic force microscopy; Control systems; Force control; Fuzzy logic; Hysteresis motors; Nonlinear control systems; Nonlinear systems; Optical control; Optical microscopy; Semiconductor device noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2002. APCCAS '02. 2002 Asia-Pacific Conference on
Print_ISBN
0-7803-7690-0
Type
conf
DOI
10.1109/APCCAS.2002.1115338
Filename
1115338
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