DocumentCode :
2605884
Title :
Applied of look up table controller based of FLC (fuzzy logic controller) in non-linear system AFM (atomic force microscopy)/PSTM (photon scanning tunnel microscope)
Author :
Ari, Santoso ; Belier, B. ; Nuh, Mohammad ; Jazidie, Achmad ; Rameli, Mochamad ; Castagne, M. ; Falgayrttes, P.
Author_Institution :
Dept. of Electr. Eng., ITS, Sukolilo, Indonesia
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
565
Abstract :
The problems of AFM/PSTM with piezoelectronic motor are how to control the fast and precise motion of the piezoelectronic because of its nonlinear hysteresis characteristic. On the other hand, in order to scan the surface and optical characteristics simultaneously in semiconductor material using AFM/PSTM, high speed microscope motion is required. FLC is one of the most effective algorithms to control a nonlinear system. This paper, the application of FLC to AFM/PSTM as a class nonlinear system is proposed. A look up table (LUT) controller based on FLC is used in order to overcome the quick response of the piezoelectronic motor. It was shown that the obtained images are noisy and the filter could not perfectly eliminate the noise. Nevertheless, the LUT controller based on FLC is able to overcome the nonlinear and noise problems well.
Keywords :
atomic force microscopy; fuzzy control; fuzzy logic; machine control; optical microscopy; physical instrumentation control; piezoelectric motors; programmable controllers; scanning tunnelling microscopy; table lookup; AFM/PSTM; FLC; LUT controller; atomic force microscopy; class nonlinear system; fuzzy logic controller; high speed microscope motion; imperfect filter noise elimination; look up table controller; motor motion control; noisy images; nonlinear hysteresis characteristic; nonlinear system control; optical characteristic; photon scanning tunnel microscope; piezoelectronic motor; semiconductor material; surface characteristic; Atomic force microscopy; Control systems; Force control; Fuzzy logic; Hysteresis motors; Nonlinear control systems; Nonlinear systems; Optical control; Optical microscopy; Semiconductor device noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. APCCAS '02. 2002 Asia-Pacific Conference on
Print_ISBN :
0-7803-7690-0
Type :
conf
DOI :
10.1109/APCCAS.2002.1115338
Filename :
1115338
Link To Document :
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