DocumentCode :
2605892
Title :
Practical Uses of Accelerated Testing at Motorola
Author :
Lycoudes, Nicholas
Author_Institution :
Bipolar I/C Reliability Engineering, Motorola Semiconductor Products Division, 5005 E. McDowell Rd., Phoenix, Arizona 85008
fYear :
1975
fDate :
27485
Firstpage :
257
Lastpage :
259
Keywords :
Aluminum; Circuit testing; Corrosion; Humidity; Integrated circuit reliability; Integrated circuit testing; Life estimation; Life testing; Plastics; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1975.362705
Filename :
4208086
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2605892
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