DocumentCode
2605903
Title
High Temperature Operating Tests (HTOT); A Control for Contaminated Microcircuit Processes
Author
Stitch, Morton
Author_Institution
McDonnell Douglas Astronautics Company - East, St. Louis, Missouri 63166
fYear
1975
fDate
27485
Firstpage
260
Lastpage
262
Keywords
Circuits; Contamination; Diffusion bonding; Extraterrestrial measurements; Manufacturing processes; Metallization; Semiconductor device packaging; Temperature control; Testing; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1975.362706
Filename
4208087
Link To Document