DocumentCode :
2605903
Title :
High Temperature Operating Tests (HTOT); A Control for Contaminated Microcircuit Processes
Author :
Stitch, Morton
Author_Institution :
McDonnell Douglas Astronautics Company - East, St. Louis, Missouri 63166
fYear :
1975
fDate :
27485
Firstpage :
260
Lastpage :
262
Keywords :
Circuits; Contamination; Diffusion bonding; Extraterrestrial measurements; Manufacturing processes; Metallization; Semiconductor device packaging; Temperature control; Testing; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1975.362706
Filename :
4208087
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2605903
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