Title :
Performance of Single Junction Thermal Voltage Converter (SJTVC) at 1 MHz via Equivalent Electrical Circuit Simulation
Author :
Halawa, Mamdouh ; Al-Rashid, Najat
Author_Institution :
Nat. Inst. for Stand., Giza, Egypt
Abstract :
The physical structure of the SJTVC can be represented via simulation using an equivalent RLC circuit to investigate the performance and estimate the error sources when using this device as a precise tool for AC voltage and current measurements. This paper describes instruments and techniques that apply on 0.6 V thermal converters to achieve this target. The technique was performed, theoretically and practically, to investigate the frequency-dependence of the SJTVC up to 1 MHz. The LTspice/SwCAD III simulator was used to analyze the effect of the physical structure of SJTVC in an effort to better understand the origin of errors at 100 kHz and 1 MHz. The practical results were firstly measured at National Institute for Standard and Technology (NIST), US to validate the simulation model at 100 kHz. The model then used to estimate the AC-DC transfer error of the SJTVC at 1 MHz. Some of the dominated error sources such as the changes of the real part of the heater impedance, the effect of thermocouple grounding and the power consumed in the internal resistance of the thermocouple are estimated at 100 kHz and 1 MHz. The expanded uncertainty assigned to the AC-DC automated calibration system of NIS is also described.
Keywords :
AC-DC power convertors; RLC circuits; earthing; equivalent circuits; error analysis; thermocouples; AC-DC automated calibration system; AC-DC transfer error estimation; LTspice/SwCAD III simulator; NIST; National Institute for Standard and Technology; SJTVC physical structure; US; current measurement; equivalent RLC circuit simulation; frequency 1 MHz; frequency 100 kHz; internal resistance; single junction thermal voltage converter; thermocouple grounding; voltage 0.6 V; Analytical models; Circuit simulation; Current measurement; Frequency; Impedance; Instruments; Measurement standards; NIST; RLC circuits; Voltage; ACDC Transfer Error; Automated Calibration System; Equivalent Circuit Simulation; Single Junction Thermal Voltage Converter; Uncertainty analysis.;
Conference_Titel :
Computer Modelling and Simulation (UKSim), 2010 12th International Conference on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-6614-6
DOI :
10.1109/UKSIM.2010.120