Title :
Auger Electron Spectroscopy
Author :
Morabito, J.M. ; Grunthaner, Frank
Author_Institution :
X-Ray Photoelectron Spectroscopy (ESCA), Chemical Diagnosis of Microelectronic Processing
Keywords :
Chemical processes; Electrons; Microelectronics; Spectroscopy;
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1976.362712