Title :
Solid-State and Nanoelectronic Devices - Nanoscale Flash and DRAM Technologies
Author :
Krishnamohan, Tejas ; Fung, Samuel
Author_Institution :
Intel Corporation and Stanford University
Keywords :
FinFETs; Flash memory; Intersymbol interference; Nanocrystals; Nanoscale devices; Nonvolatile memory; Photonic band gap; Random access memory; SONOS devices; Solid state circuits;
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
DOI :
10.1109/IEDM.2007.4419099