DocumentCode :
2606298
Title :
Measurement of Land to Plated-Through-Hole Interface Resistance in Multilayer Boards
Author :
Hines, J.N.
Author_Institution :
Bell Laboratories, Whippany, New Jersey 07981, (201) 386-3000
fYear :
1976
fDate :
27851
Firstpage :
132
Lastpage :
134
Abstract :
Thermally induced cracks can occur at the interface between land and PTE barrel, hence, a measure of electrical continuity of the interface connection is important in product quality assessment and reliability projection. Series circuits with poor resolution are generally used to monitor circuit integrity during thermal tests. A much more sensitive method of measuring the interface directly is described.
Keywords :
Circuit testing; Contact resistance; Current measurement; Electrical resistance measurement; Life testing; Nonhomogeneous media; Thermal resistance; Thermal stresses; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1976.362732
Filename :
4208116
Link To Document :
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