• DocumentCode
    2606298
  • Title

    Measurement of Land to Plated-Through-Hole Interface Resistance in Multilayer Boards

  • Author

    Hines, J.N.

  • Author_Institution
    Bell Laboratories, Whippany, New Jersey 07981, (201) 386-3000
  • fYear
    1976
  • fDate
    27851
  • Firstpage
    132
  • Lastpage
    134
  • Abstract
    Thermally induced cracks can occur at the interface between land and PTE barrel, hence, a measure of electrical continuity of the interface connection is important in product quality assessment and reliability projection. Series circuits with poor resolution are generally used to monitor circuit integrity during thermal tests. A much more sensitive method of measuring the interface directly is described.
  • Keywords
    Circuit testing; Contact resistance; Current measurement; Electrical resistance measurement; Life testing; Nonhomogeneous media; Thermal resistance; Thermal stresses; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1976. 14th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1976.362732
  • Filename
    4208116