Title :
Measurement of Land to Plated-Through-Hole Interface Resistance in Multilayer Boards
Author_Institution :
Bell Laboratories, Whippany, New Jersey 07981, (201) 386-3000
Abstract :
Thermally induced cracks can occur at the interface between land and PTE barrel, hence, a measure of electrical continuity of the interface connection is important in product quality assessment and reliability projection. Series circuits with poor resolution are generally used to monitor circuit integrity during thermal tests. A much more sensitive method of measuring the interface directly is described.
Keywords :
Circuit testing; Contact resistance; Current measurement; Electrical resistance measurement; Life testing; Nonhomogeneous media; Thermal resistance; Thermal stresses; Wire; Wiring;
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1976.362732