Title :
Simulation of Thermal Stress Stimuli in the Testing of Printed Wiring Products
Author :
Ammann, H.H. ; Farkass, I.
Author_Institution :
Bell Laboratories, Whippany, New Jersey 07981, (201) 386-3000
Abstract :
Simulated thermal stress stimuli are used for reliability testing and quality assessment of printed wiring products. Heat transfer is discussed in terms of internal conduction and measured surface convection coefficients encountered during manufacture and testing. The fluidized particulate bath is discussed as an attractive medium for applying thermal stress stimuli.
Keywords :
Capacitive sensors; Cooling; Dielectrics; Heat transfer; Heating; Soldering; Temperature; Testing; Thermal stresses; Wiring;
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1976.362734