Title :
A Study of Dielectric Absorption in Capacitors by Thermally Stimulated Discharge (TSD) Tests
Author :
Burnham, J. ; Webster, S.L. ; Simmons, W.J. ; Borough, J.W.
Author_Institution :
Hughes Aircraft Company, Culver City, California 90232
Abstract :
The dielectric absorption (DA) of capacitors with various dielectrics has been studied by the use of Thermally Stimulated Discharge (TSD). It has been shown that this test gives a much more accurate measurement of DA and in addition gives information about the mechanism of absorption. The charge determined by TSD has been correlated with noise which reduces the reliability of the capacitors in high gain circuits.
Keywords :
Absorption; Capacitors; Charge measurement; Circuit testing; Current measurement; Dielectric measurements; History; Temperature distribution; Time measurement; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1976.362735
