Title :
Fusing Mechanism of Nichrome-Linked Programmable Read-Only Memory Devices
Author :
Kenney, G.B. ; Jones, W.Kinzy ; Ogilvie, R.E.
Author_Institution :
Massachusetts Institute of Technology, Cambridge, Mass. 02139
Keywords :
Fuses; Laboratories; PROM; Resistors; Spatial resolution; Stability; Surface tension; Surface waves; Transmission electron microscopy; Viscosity;
Conference_Titel :
Reliability Physics Symposium, 1976. 14th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1976.362737
