• DocumentCode
    2606452
  • Title

    Integrated design and test generation under internet based environment MOSCITO

  • Author

    Schneider, A. ; Ivask, E. ; Ubar, Raimund

  • Author_Institution
    Fraunhofer Inst. for Integrated Circuits
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    187
  • Lastpage
    194
  • Abstract
    This paper describes an environment for internet-based collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.
  • Keywords
    Internet; VLSI; automatic test pattern generation; fault simulation; hardware description languages; integrated circuit testing; programming environments; Internet based environment MOSCITO; automatic test pattern generation; fault simulation tools; hierarchical levels; integrated design and test generation; integrated tools; system-on-chip technology; virtual environment; Automatic test pattern generation; Circuit faults; Communication system control; Design engineering; Digital systems; Electronic design automation and methodology; Internet; Java; System testing; Virtual environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design, 2002. Proceedings. Euromicro Symposium on
  • Print_ISBN
    0-7695-1790-0
  • Type

    conf

  • DOI
    10.1109/DSD.2002.1115368
  • Filename
    1115368