DocumentCode
2606452
Title
Integrated design and test generation under internet based environment MOSCITO
Author
Schneider, A. ; Ivask, E. ; Ubar, Raimund
Author_Institution
Fraunhofer Inst. for Integrated Circuits
fYear
2002
fDate
2002
Firstpage
187
Lastpage
194
Abstract
This paper describes an environment for internet-based collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.
Keywords
Internet; VLSI; automatic test pattern generation; fault simulation; hardware description languages; integrated circuit testing; programming environments; Internet based environment MOSCITO; automatic test pattern generation; fault simulation tools; hierarchical levels; integrated design and test generation; integrated tools; system-on-chip technology; virtual environment; Automatic test pattern generation; Circuit faults; Communication system control; Design engineering; Digital systems; Electronic design automation and methodology; Internet; Java; System testing; Virtual environment;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design, 2002. Proceedings. Euromicro Symposium on
Print_ISBN
0-7695-1790-0
Type
conf
DOI
10.1109/DSD.2002.1115368
Filename
1115368
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