• DocumentCode
    2606498
  • Title

    Study of Thermal-runaway tests on Insulators subjected to DC voltages

  • Author

    Muralidhara, V. ; Ramachandra, B. ; Vasudev, N. ; Nambudiri, P. V Vasudevan ; Ravi, K.N. ; Sriramulu

  • Author_Institution
    B.I.T., Bangalore, India
  • fYear
    2008
  • fDate
    9-12 Nov. 2008
  • Firstpage
    28
  • Lastpage
    31
  • Abstract
    The failure of insulators under DC voltages is due to various factors like thermal runaway, ion migration, anode growth, surface erosion, cement growth etc... However, the rate of failure is higher in polluted zones where surface erosion and puncturing of insulators due to ion migration can occur. Therefore, insulators have to be subjected to accelerated ageing tests to simulate ion migration and to check their capability to withstand the stresses. Thermal runaway is also an important test. By carrying out thermal runaway test at higher temperature, it may be possible to identify the good insulators. This paper presents the work carried out in order to find the quality of DC insulators by thermal runaway tests and the measurement of the body resistance of the insulators. The voltage and temperature were varied during these tests in order to clearly differentiate the quality of insulators. The result will be useful for the design of insulators for the HVDC transmission system.
  • Keywords
    ageing; electric resistance measurement; failure analysis; insulator testing; DC voltage condition; HVDC transmission system; ageing tests; insulator failure analysis; insulator puncturing; insulator surface erosion; ion migration; resistance measurement; thermal-runaway tests; Accelerated aging; Anodes; Insulation; Insulator testing; Pollution; Surface contamination; Temperature; Thermal factors; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-3823-5
  • Electronic_ISBN
    978-1-4244-2810-6
  • Type

    conf

  • DOI
    10.1109/ICHVE.2008.4773865
  • Filename
    4773865