Title :
Study Of A Now VTR Head Scanning Method
Author :
Kato, D. ; Kasai, H. ; Muto, K. ; Sekiguchi, T.
Author_Institution :
NHK Science and Technical Research Laboratories
Keywords :
CADCAM; Computer aided manufacturing; Laboratories; Linearity; Magnetic heads; Radio frequency; Testing; Torque; Vibrations; Video recording;
Conference_Titel :
Consumer Electronics, 1993. Digest of Technical Papers. ICCE., IEEE 1993 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0843-3
DOI :
10.1109/ICCE.1993.697557
