Title :
Statistical Characterization Of Intermittent Faults In Digital Systems
Author :
Varshney, Pramod K.
Author_Institution :
Syracuse University
Keywords :
Analytical models; Circuit faults; Digital circuits; Digital systems; Electrical fault detection; Fault detection; Fault diagnosis; Fault tolerance; Predictive models; Stochastic processes;
Conference_Titel :
Circuits, Systems and Computers, 1977. Conference Record. 1977 11th Asilomar Conference on
DOI :
10.1109/ACSSC.1977.748966
