Accurate measurement of power/ground impedance with embedded film capacitor using two-port self-impedance measurement technique

Author

Kim, Hyungsoo ; Jeong, Youchul ; Park, Jongbae ; SeokKyu-lee ; JongKuk-Hong ; Hong, Youngsoo ; Kim, Joungho

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejon, South Korea

fYear

2003

fDate

10-12 Dec. 2003

Firstpage

51

Lastpage

54

Abstract

In this paper, we have demonstrated the accurate measurement of power/ground impedance with embedded film capacitors, using the two-port self-impedance measurement technique. With the two-port self-impedance measurement, it was found that the unwanted series contact resistance between the microprobe and the contact pad on the PCB and package was successfully eliminated.

Keywords

circuit testing; electric impedance measurement; probes; thin film capacitors; two-port networks; PCB contact pad; SSN; embedded film capacitors; microprobe/contact pad series contact resistance; power/ground impedance; simultaneous switching noise; two-port self-impedance measurement technique; Capacitors; Clocks; Contact resistance; Electrical resistance measurement; Frequency; Impedance measurement; Measurement techniques; Packaging; Power measurement; Power supplies;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)

Print_ISBN

0-7803-8205-6

Type

conf

DOI

10.1109/EPTC.2003.1271489

Filename

1271489