DocumentCode
2606803
Title
Testability for all seasons
Author
Hartwell, Robert E.
Author_Institution
General Electric Co., Burlington, MA, USA
fYear
1990
fDate
17-21 Sep 1990
Firstpage
387
Lastpage
394
Abstract
The author discusses the many roles of the testability engineer throughout the development cycle and summarizes successful techniques which have been used on a FSD program. The preplanned use of common BIT (built-in test) software throughout all echelons of maintenance and at the factory is reported. The author identifies many compelling reasons to design for testability, including MIL-STD-2165 compliance. The growing need for BIT and testability designed concurrently with hardware is cited along with the substantial potential for savings in manufacture, life-cycle maintenance, and maintenance support system costs. The role of the testability engineer in the development of a product is shown to be pervasive throughout the project, varied in scope and context, and highly demanding in knowledge and skills
Keywords
automatic testing; built-in self test; electronic equipment testing; fault location; maintenance engineering; military systems; production testing; BIT; FSD program; MIL-STD-2165; factory; maintenance; military systems; testability engineer; Built-in self-test; Costs; Design for testability; Embedded software; Hardware; Life testing; Manufacturing; Production facilities; Software maintenance; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location
San Antonio, TX
Type
conf
DOI
10.1109/AUTEST.1990.111539
Filename
111539
Link To Document