DocumentCode :
2606803
Title :
Testability for all seasons
Author :
Hartwell, Robert E.
Author_Institution :
General Electric Co., Burlington, MA, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
387
Lastpage :
394
Abstract :
The author discusses the many roles of the testability engineer throughout the development cycle and summarizes successful techniques which have been used on a FSD program. The preplanned use of common BIT (built-in test) software throughout all echelons of maintenance and at the factory is reported. The author identifies many compelling reasons to design for testability, including MIL-STD-2165 compliance. The growing need for BIT and testability designed concurrently with hardware is cited along with the substantial potential for savings in manufacture, life-cycle maintenance, and maintenance support system costs. The role of the testability engineer in the development of a product is shown to be pervasive throughout the project, varied in scope and context, and highly demanding in knowledge and skills
Keywords :
automatic testing; built-in self test; electronic equipment testing; fault location; maintenance engineering; military systems; production testing; BIT; FSD program; MIL-STD-2165; factory; maintenance; military systems; testability engineer; Built-in self-test; Costs; Design for testability; Embedded software; Hardware; Life testing; Manufacturing; Production facilities; Software maintenance; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111539
Filename :
111539
Link To Document :
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