DocumentCode
2606850
Title
Soft Failure Modes in MOS RAMS
Author
Sie, C.H. ; Youngblood, R.A. ; Liao, J.H. ; Turk, A.
Author_Institution
Xerox Corporation, El Segundo, California 90245. 213-679-4511 X1327
fYear
1977
fDate
28216
Firstpage
27
Lastpage
32
Keywords
DRAM chips; Error correction; Gaussian distribution; Integrated circuit noise; Microcomputers; Random access memory; Read-write memory; Stress; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location
LAs Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1977.362768
Filename
4208155
Link To Document