Title :
Limits to predictability in 2000 and 2100
Author :
Smith, Leonard A.
Author_Institution :
London Sch. of Econ. & Political Sci., UK
Abstract :
Deterministic chaos is widely thought to place the ultimate limit on our ability to forecast. While chaos certainly limits our ability to predict precise outcomes in the perfect model experiments of which theorists are most fond, this paper explores the role of uncertainty in real physical systems: a simple nonlinear circuit, the weather next week, and the Earth´s climate system. Here model error, not uncertain observations, may pose the more fundamental limit to prediction; this is true whether one prefers stochastic or deterministic models. A crucial difference between the circuit and the atmosphere is one of time scales: the duration over which we can observe the circuit seems long in terms of all of its natural periods, never-the-less it is error in our model(s) that prevents reliable forecasts. How should we model physical systems on time scales over which we know our models are flawed? How might we predict the weather, climate and nonlinear circuits in 2100? Will we have deployed `improved techniques´? Or will we have altered our aims in understanding and predicting nonlinear systems?
Keywords :
climatology; error analysis; nonlinear network analysis; prediction theory; stochastic processes; technological forecasting; AD 2000; AD 2100; Earth´s climate system; climate prediction; deterministic chaos; deterministic models; forecasting; model error; natural periods; nonlinear circuit; nonlinear systems prediction; perfect model experiments; predictability limits; real physical systems; stochastic models; time scales; uncertainty; weather next week; Atmosphere; Atmospheric modeling; Chaos; Earth; Nonlinear circuits; Nonlinear systems; Predictive models; Stochastic processes; Uncertainty; Weather forecasting;
Conference_Titel :
Adaptive Systems for Signal Processing, Communications, and Control Symposium 2000. AS-SPCC. The IEEE 2000
Conference_Location :
Lake Louise, Alta.
Print_ISBN :
0-7803-5800-7
DOI :
10.1109/ASSPCC.2000.882459