Title :
The Role of Hybrid Construction Techniques on Sealed Moisture Levels
Author :
Somerville, D.T.
Author_Institution :
Rockwell International, 1200 North Alma Road, Richardson, Texas 75081. (214) 690-6438
Abstract :
Residual gas analysis techniques are employed to measure the moisture in sealed hybrid packages as a function of substrate attach material, vacuum bake time and sequence, and sealing procedure. It is shown that, when room atmospheric exposure is eliminated following the vacuum bake-out, moisture levels of less than 1000 ppm may be achieved for modest bake times and solder substrate attach techniques. Suitable moisture levels were achieved for epoxy attached substrates only when seam sealing procedures were employed.
Keywords :
Conductive films; Fabrication; Gold; Moisture; Resistors; Sealing materials; Semiconductor device packaging; Substrates; Tin; Vacuum technology;
Conference_Titel :
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location :
LAs Vegas, NV, USA
DOI :
10.1109/IRPS.1977.362779