Title :
Properties of CuPc/Se organics-inorganic hybrid thin films growth by electron beam evaporation technique
Author :
Tunhoo, Benchapol ; Thiwawong, Thutiyaporn ; Nukeaw, Jiti
Author_Institution :
Nanotechnol. Res. Center, King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok
Abstract :
Organic and Inorganic materials with copper (II) phthalocyanine (CuPc) and selenium (Se) were deposited to implement hybrid thin films by multi pocket electron beam evaporation technique. Crystallization of hybrid films was performed by X-ray diffraction (XRD) spectroscopy. XRD pattern exhibits monoclinic alpha-phase crystallizations structure of CuPc. Influences of the CuPc thickness on the crystalline structure of selenium films were obtained. As the thickness of CuPc layer was increased to 100 nm, the hexagonal Se was observed. Optical absorption spectra were measured by UV-Visible spectrophotometer. Results of hybrid absorption spectra were revealed to absorption spectra of CuPc and Se. Surface roughness of films can confirm with XRD spectra. The surface morphology was characterized by atomic force microscope (AFM) with non-contact mode, it illustrate the point that hybrid thin films is nanocrystal structure.
Keywords :
X-ray diffraction; atomic force microscopy; copper compounds; crystallisation; electron beam deposition; elemental semiconductors; nanostructured materials; organic semiconductors; organic-inorganic hybrid materials; selenium; semiconductor growth; semiconductor thin films; spectrophotometry; surface morphology; surface roughness; ultraviolet spectra; visible spectra; AFM; CuPc; Se; UV spectrophotometry; X-ray diffraction; XRD; atomic force microscopy; copper (II) phthalocyanine; crystallization; electron beam evaporation technique; nanocrystal structure; optical absorption spectra; organics-inorganic hybrid thin films; selenium; surface morphology; surface roughness; visible spectrophotometry; Absorption; Atomic force microscopy; Crystallization; Electron beams; Optical films; Rough surfaces; Surface morphology; Surface roughness; Transistors; X-ray scattering; Nanotechology; Semiconductor Growth; Semiconductor films; hybrid thin films;
Conference_Titel :
Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-0607-4
Electronic_ISBN :
978-1-4244-0608-1
DOI :
10.1109/NANO.2007.4601350
