DocumentCode
2607071
Title
An Accelerated Method for Effective Process Control of Plastic Encapsulated Nichrome PROMS
Author
Ferro, Joseph A.
Author_Institution
Fairchild Semiconductor, 464 Ellis Street, Mountain View, California 94042. (415) 962-4277
fYear
1977
fDate
28216
Firstpage
125
Lastpage
127
Abstract
A Biased Pressure Temperature Humidity (BPTH) test has been developed as a process control for plastic encapsulated nichrome link PROMs and a control limit established assuring reliability better than 0.001%/1,000 hours. Correlation has been made between BPTH and 85°C/85% Relative Humidity Bias testing giving an acceleration factor of 20. Chemical vapor deposited phosphovapox and plasma deposited silicon nitride were evaluated as glassivation techniques. Silicon nitride has demonstrated improved life times greater than three times that of phosphovapox glassivation and five times that of non-glassivated devices.
Keywords
Acceleration; Humidity control; PROM; Plasma temperature; Plastics; Pressure control; Process control; Silicon; Temperature control; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location
LAs Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1977.362782
Filename
4208169
Link To Document