Title :
An Accelerated Method for Effective Process Control of Plastic Encapsulated Nichrome PROMS
Author :
Ferro, Joseph A.
Author_Institution :
Fairchild Semiconductor, 464 Ellis Street, Mountain View, California 94042. (415) 962-4277
Abstract :
A Biased Pressure Temperature Humidity (BPTH) test has been developed as a process control for plastic encapsulated nichrome link PROMs and a control limit established assuring reliability better than 0.001%/1,000 hours. Correlation has been made between BPTH and 85°C/85% Relative Humidity Bias testing giving an acceleration factor of 20. Chemical vapor deposited phosphovapox and plasma deposited silicon nitride were evaluated as glassivation techniques. Silicon nitride has demonstrated improved life times greater than three times that of phosphovapox glassivation and five times that of non-glassivated devices.
Keywords :
Acceleration; Humidity control; PROM; Plasma temperature; Plastics; Pressure control; Process control; Silicon; Temperature control; Testing;
Conference_Titel :
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location :
LAs Vegas, NV, USA
DOI :
10.1109/IRPS.1977.362782