• DocumentCode
    2607071
  • Title

    An Accelerated Method for Effective Process Control of Plastic Encapsulated Nichrome PROMS

  • Author

    Ferro, Joseph A.

  • Author_Institution
    Fairchild Semiconductor, 464 Ellis Street, Mountain View, California 94042. (415) 962-4277
  • fYear
    1977
  • fDate
    28216
  • Firstpage
    125
  • Lastpage
    127
  • Abstract
    A Biased Pressure Temperature Humidity (BPTH) test has been developed as a process control for plastic encapsulated nichrome link PROMs and a control limit established assuring reliability better than 0.001%/1,000 hours. Correlation has been made between BPTH and 85°C/85% Relative Humidity Bias testing giving an acceleration factor of 20. Chemical vapor deposited phosphovapox and plasma deposited silicon nitride were evaluated as glassivation techniques. Silicon nitride has demonstrated improved life times greater than three times that of phosphovapox glassivation and five times that of non-glassivated devices.
  • Keywords
    Acceleration; Humidity control; PROM; Plasma temperature; Plastics; Pressure control; Process control; Silicon; Temperature control; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1977. 15th Annual
  • Conference_Location
    LAs Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1977.362782
  • Filename
    4208169