DocumentCode :
260715
Title :
Optimized cluster validation technique for unsupervised clustering techniques
Author :
Krishnamoorthy, R. ; Sreedhar Kumar, S.
Author_Institution :
Dept. of CSE, Anna Univ., Chennai, India
fYear :
2014
fDate :
27-28 Feb. 2014
Firstpage :
1
Lastpage :
6
Abstract :
In this paper, a new cluster validation technique called Optimized Cluster Validation (OCV) is presented. The proposed technique is aimed to measure the purity and impurity over the resulting cluster of the unsupervised clustering techniques. The proposed OCV technique consists of two measures which are Purity Measure (PM) and Impurity Measure (IM). The first measure (PM), is aimed to measure the intra cluster similarity or intra cluster purity, and it evaluates the overall resulting cluster quality or accuracy or purity. The second measure (IM), is evaluate the intra cluster dissimilarity or intra cluster impurity over the resulting cluster of the unsupervised clustering technique. The experimental results show that the OCV technique is simple and effective to evaluate the intra cluster similarity and dissimilarity around the resulting cluster of the unsupervised clustering techniques.
Keywords :
optimisation; pattern clustering; unsupervised learning; OCV technique; impurity measure; intra cluster purity; intra cluster similarity; optimized cluster validation technique; purity measure; unsupervised clustering techniques; Accuracy; Educational institutions; Equations; Impurities; Noise measurement; Object recognition; Size measurement; Impurity Measure (IM); Optimized Cluster Validation (OCV); Purity Measure (PM); hierarchical clustering and partitioning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Communication and Embedded Systems (ICICES), 2014 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4799-3835-3
Type :
conf
DOI :
10.1109/ICICES.2014.7033782
Filename :
7033782
Link To Document :
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