DocumentCode

2607201

Title

Screening Results of JAN Transistors and Diodes Used in Military and Aerospace Programs

Author

Scheffel, Paul E.

Author_Institution

DCA Reliability Laboratory, Sunnyvale, California 94086. (408) 245-7100

fYear

1977

fDate

28216

Firstpage

163

Lastpage

165

Keywords

Aerospace electronics; Aerospace engineering; Aerospace testing; Data engineering; Diodes; Inspection; Manufacturing; NASA; Procurement; Space shuttles;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1977. 15th Annual

Conference_Location

LAs Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1977.362789

Filename

4208176