• DocumentCode
    2607278
  • Title

    Accelerated Testing of Class a CMOS Integrated Circuits

  • Author

    Maximow, B. ; Reiss, E.M. ; Kukunaris, S.

  • Author_Institution
    RCA Solid State Division, Somerville, N.J. 08876. 201-685-6348
  • fYear
    1977
  • fDate
    28216
  • Firstpage
    212
  • Lastpage
    216
  • Abstract
    The need for a practical accelerated test for Class A CMOS integrated circuits is recognized. The present 250°C/250-hour test condition is neither applicable nor practical as a group B lot acceptance test. The previously reported activation energy was basically confirmed between 200°C and 250°C on the tested CMOS device types (1.0 - 1.4 MeV). The validity of extrapolations down to operating temperatures based on accelerated tests must be experimentally confirmed. Therefore, continued long-term testing at 125°C is necessary.
  • Keywords
    CMOS integrated circuits; CMOS logic circuits; Circuit testing; Extrapolation; Integrated circuit testing; Lead; Life estimation; Life testing; Solid state circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1977. 15th Annual
  • Conference_Location
    LAs Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1977.362794
  • Filename
    4208181