DocumentCode :
2607278
Title :
Accelerated Testing of Class a CMOS Integrated Circuits
Author :
Maximow, B. ; Reiss, E.M. ; Kukunaris, S.
Author_Institution :
RCA Solid State Division, Somerville, N.J. 08876. 201-685-6348
fYear :
1977
fDate :
28216
Firstpage :
212
Lastpage :
216
Abstract :
The need for a practical accelerated test for Class A CMOS integrated circuits is recognized. The present 250°C/250-hour test condition is neither applicable nor practical as a group B lot acceptance test. The previously reported activation energy was basically confirmed between 200°C and 250°C on the tested CMOS device types (1.0 - 1.4 MeV). The validity of extrapolations down to operating temperatures based on accelerated tests must be experimentally confirmed. Therefore, continued long-term testing at 125°C is necessary.
Keywords :
CMOS integrated circuits; CMOS logic circuits; Circuit testing; Extrapolation; Integrated circuit testing; Lead; Life estimation; Life testing; Solid state circuits; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location :
LAs Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1977.362794
Filename :
4208181
Link To Document :
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