Title :
Comparison of mechanical response of PCBs subjected to product-level and board-level drop impact tests
Author :
Ong, Y.C. ; Shim, V.P.W. ; Chai, T.C. ; Lim, C.T.
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
Portable electronic products such as mobile phones are susceptible to drop impacts. Consequently, the effects of impact and shock on the integrity of the electronic components on a printed circuit board (PCB) are important mechanical reliability issues that need to be addressed, Mechanical shock tests for electronic components generally fall into two categories: board-level and product-level. The most realistic shock tests would be product-level tests on completed products. However, board-level tests simplify real-life drop impact scenarios. This paper provides insights into how comprehensive board-level testing is in duplicating the state of loading experienced by components in product level drop tests. The mechanical responses of PCBs in terms of impact force, acceleration and strains from both types of drop tests are examined and compared. These findings constitute the basis needed for future development of realistic board-level tests to replicate product-level tests.
Keywords :
consumer electronics; electronic products; impact testing; mobile handsets; printed circuit testing; telecommunication equipment testing; acceleration; board-level drop impact tests; impact force; mechanical reliability; mechanical responses; mechanical shock tests; mobile phones; portable electronic products; printed circuit board; product-level drop impact tests; strains; Capacitive sensors; Circuit testing; Electric shock; Electronic components; Electronic equipment testing; Integrated circuit interconnections; Laboratories; Mechanical engineering; Mobile handsets; Personal digital assistants;
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
DOI :
10.1109/EPTC.2003.1271520