DocumentCode :
2607332
Title :
Metallic Contact on GaAs Microwave Devices
Author :
Omori, M.
Author_Institution :
Solid State West, Varian Associates, 611 Hansen Way, Palo Alto, CA 94303; Avantek, Inc., 3175 Bowers Avenue, Santa Clara, CA 95051
fYear :
1977
fDate :
28216
Firstpage :
232
Lastpage :
239
Keywords :
Degradation; Diodes; Gallium arsenide; Gold; Gunn devices; Life testing; Microwave devices; Ohmic contacts; Sputter etching; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location :
LAs Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1977.362798
Filename :
4208185
Link To Document :
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