Analysis of reflectarrays printed above variable substrate thicknesses

Author

Inam, M. ; Ismail, M.Y. ; Zain, A.F.M. ; Mughal, M.A.

Author_Institution

Wireless & Radio Sci. Centre (WARAS), Univ. Tun Hussein Onn Malaysia (UTHM), Batu Pahat, Malaysia

fYear

2010

fDate

9-11 Nov. 2010

Firstpage

1

Lastpage

4

Abstract

This paper presents a thorough investigation of the effects of substrate thickness on the performance of infinite reflectarrays. The reflectarrays designed in the X-band frequency range are investigated in terms of electric field intensity, reflection loss and reflection phase performance. It has been demonstrated that the electric field intensity decreases from 3.42e5V/m to 2.34e5V/m as the thickness of the substrate is increased from 0.2mm to 2.0mm. The measured reflection loss has been shown to decrease from 15dB to 2.25dB as the substrate thickness is changed from 0.127mm to 0.381mm. Furthermore the effect of substrate thickness on the reflection phase performance has also been demonstrated by waveguide scattering parameter measurements.

Keywords

S-parameters; microstrip antenna arrays; microwave antenna arrays; reflector antennas; X-band; electric field intensity; infinite reflectarrays; loss 15 dB; loss 2.25 dB; patch element; reflection loss; reflection phase performance; size 0.127 mm; size 0.2 mm to 2.0 mm; size 0.381 mm; variable substrate thickness; waveguide scattering parameter; Bandwidth; Loss measurement; Phase measurement; Reflection; Reflector antennas; Substrates; Thickness measurement; Bandwidth; Reflectarray; Reflection loss; Reflection phase; Substrate thickness;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Electromagnetics (APACE), 2010 IEEE Asia-Pacific Conference on

Conference_Location

Port Dickson

Print_ISBN

978-1-4244-8565-9

Type

conf

DOI

10.1109/APACE.2010.5720081

Filename

5720081