DocumentCode :
2607501
Title :
Compact modeling of anomalous high frequency behavior of MOSFET´s small-signal NQS parameters in presence of velocity saturation
Author :
Roy, A.S. ; Sallese, J. -M ; Enz, C.C.
Author_Institution :
Ecole Polytechnique Federale de Lausanne, Switzerland
fYear :
2005
fDate :
12-16 Sept. 2005
Firstpage :
141
Lastpage :
144
Abstract :
In this work we present a physics based compact small-signal nonquasi static (NQS) model for MOST including velocity saturation and demonstrate that this can substantially change the behavior of the gate transadmittance (ydg) in saturation at high frequency. The magnitude of ydg starts to increase (instead of decreasing) after a certain frequency and its real part also starts to increase in negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also effect the ydg in a similar way.
Keywords :
MOSFET; semiconductor device models; MOSFET devices; anomalous high frequency behavior; compact small-signal nonquasi static model; gate transadmittance; long channel MOST device; small-signal NQS parameters; velocity saturation; weak inversion charge; Analytical models; Capacitance; Degradation; Frequency; Leg; MOSFET circuits; Physics; Predictive models; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN :
0-7803-9203-5
Type :
conf
DOI :
10.1109/ESSDER.2005.1546605
Filename :
1546605
Link To Document :
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