Title :
Impact of SAR on human head modeling in Elevators using IFA
Author :
Priyadarshini, S. Jemima ; Mary, T. Anita Jones ; Sugumar, D. ; Ravichandran, C.S.
Author_Institution :
Dept. of Electron. & Commun., Karunya Univ., Coimbatore, India
Abstract :
This Paper proposes a pragmatic approach to determine and analyze the effects of radio frequency on human exposure. A scenario in which a Mobile Phone is used inside a partially closed elevator and fully closed Elevators is considered. Elevators are metallic enclosures but still are known to have resonance and reflection effects, thereby increasing electric field strength and resulting in change in levels of human exposure to Electromagnetic absorptions. So this paper examines and compares the levels of absorption in terms of SAR values under various conditions. In this paper a human phantom with dielectric properties is designed and its interaction is studied with IFA under three conditions free space, elevators in partially closed and full closed conditions. The results shows that SAR computation and its value seems to be increased in partially closed elevator and greatly in fully closed elevators as compared to free space. The method of computation uses MOM. Simulations are done by FEKO software.
Keywords :
antennas; bioelectric phenomena; biological effects of microwaves; electromagnetic wave absorption; electromagnetic wave propagation; electromagnetic wave reflection; mobile handsets; resonance; FEKO software; IFA handset antenna; SAR; dielectric properties; electric field strength; electromagnetic absorption; fully closed elevator; human head modeling; human phantom; human radiofrequency exposure; inverted F antenna; metallic enclosures; mobile phone; partially closed elevator; radiofrequency electromagnetic reflection effects; radiofrequency electromagnetic resonance effects; Antennas; Elevators; Humans; Moment methods; Resonant frequency; Specific absorption rate; Dielectric properties; IFA; MOM; SAR;
Conference_Titel :
Applied Electromagnetics (APACE), 2010 IEEE Asia-Pacific Conference on
Conference_Location :
Port Dickson
Print_ISBN :
978-1-4244-8565-9
DOI :
10.1109/APACE.2010.5720085