DocumentCode

2607587

Title

Electrical Overstress Failure Analysis in Microcircuits

Author

Smith, J.S.

Author_Institution

Lockheed Palo Alto Research Laboratory, Palo Alto, CA 94304

fYear

1978

fDate

28581

Firstpage

41

Lastpage

46

Keywords

Aluminum; Contacts; Earth Observing System; Electric resistance; Failure analysis; Metallization; Power dissipation; Silicon; Temperature; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1978. 16th Annual

Conference_Location

San Diego, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1978.362816

Filename

4208206