Title :
Assembly and reliability performance of flip chip with no-flow underfills
Author :
Lam, Chua Khoon ; Lee, Charles
Author_Institution :
Assembly & Interconnect Technol., Infineon Technol. Asia Pacific Pte Ltd., Singapore, Singapore
Abstract :
The objective of this paper is to investigate the feasibility of using no-flow underfill and to understand the effect of die size, filter size, filler loading and solder mask design on assembly and reliability performance. Flip chip on board (FCOB) test vehicles at 200 μm pitch with 5×5 mm2 and 10×10 mm2 die were used in this study along with 11 no-flow underfill materials with varying filler sizes and loadings. Daisy-chain resistance measurement was used as a criterion for the assembly yield characterization and reliability performance assessment. In general, no-flow underfills with silica fillers ≥1 μm were observed to have poor wettability of the solder joints due to filler entrapment between the solder bump and pad on the test board. The 5×5 mm2 die was found to have better performance in temperature cycling and moisture sensitivity testing than the 10×10 mm2 die. For good temperature cycling performance, a small die with a low CTE no-flow underfill is recommended.
Keywords :
chip-on-board packaging; circuit reliability; flip-chip devices; soldering; surface mount technology; thermal management (packaging); assembly performance; assembly yield characterization; daisy-chain resistance measurement; die size; filler loading; filter size; flip chip on board; low CTE underfill; no-flow underfill; reliability performance; solder mask design; temperature cycling performance; underfill encapsulants; Assembly; Electrical resistance measurement; Filters; Flip chip; Materials testing; Moisture; Silicon compounds; Soldering; Temperature sensors; Vehicles;
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
DOI :
10.1109/EPTC.2003.1271541